State-of-the-art facilities available for users.
| Sr. No | Name of the Instrument | Make/Model | Available options |
|---|---|---|---|
| 1 | Hi-Resolution Transmission Electron Microscope (HRTEM) | JEOL Japan,JEM-2100 Plus | Imaging (TEM and HRTEM), SAED, EDXA, STEM with mapping |
| 2 | X-Ray Diffractometer (XRD) | BRUKER USA D8 Advance, Davinci | Powder and Thin film geometry.
Small angle X-ray scattering (SAXS) |
| 3 | Nitrogen absorption/desorption equipment for surface area analysis | Quantachrome Instruments, Autosorb IQ series | Pore-Size Distribution, BET Surface Area, Pore Volume etc. |
| 4 | Hi-Resolution Scanning Electron Microscope (HRSEM) | Thermosceintific Apreo S | Imaging modes (Standard, HR-SEM, STEM, dispersion mode, Opti-mode (magnetic samples)), low vacuum, EDX and Elemental mappings. |
| 5 | Infinite 200 PRO | Teecan | ELISA with temperature controller and shacking.
DNA/RNA quantification |
| 6 | Real-Time PCR Detection System | CFX Connect BIO-RAD | Detection with SYBR green or FAM only at a wavelength of 450–580nm
96 wells (0.2ml) |
| 7 | GBOX - Gel Documentation System | SYNGENE GBOX-Chemi-XRQ | Gel Documentation & Blot Documentation |
| 8 | Total Organic Carbon Analyzer (TOC) | TOC-L CPN SHIMADZU | Detect carbon content in an organic solution in ppm level |
| 9 | Hi-Resolution Mass spectrometry (HRMS) | Agilent technologies, 6230 | Predict Molecular weight. |
| 10 | Mini Micro pulse Lidar System | MiniMPL-5231 of sigma space corporation, USA | Backscattering coefficient Extinction coefficient Columnar AOD ABL Height Cloud Height Cloud optical depth |
| 11 | Metallurgical Microscope | Leica microsystems/ Leica DM2700 M | Microscopic level Imaging view for solid materials |
| 12 | Quartz vacuum sealing set up | Thulir vacuum technologies, Chennai | Vacuum sealing of quartz tubes at low pressure |
| 13 | Plasma cleaner | Diener gmbh, Germany | Plasma cleaning |
| 14 | Photoluminescence spectrometer | Flurolog HORIBA | 1) Steady state fluorescence 2) Temperature dependent PL 3) Quantum Yield 4) NIR-PL |
| 15 | Optical Profilometer | KLA corporation, CA, USA (MicroXAM-800) | A non-contact, 3D surface topography measurement system |
| 16 | Class AAA solar simulator | Newport Corporation, USA | I-V measurement under standard AM1.5 illumination |
| 17 | Scanning Tunneling Microscope (pA-STM) | APE Research, Italy | Surface Imaging with Constant Current/ Height mode,I-V spectroscopy |
| 18 | LightCycler® 96 Real-Time PCR System | Switzerland/LightCycler® 96 Instrument | Relative Quantification Absolute Quantification Melting Peak Endpoint Genotyping High Resolution Melting Qualitative Detection |
| 19 | Trace Analyser | Metrohm 797 VA Computrace | Determination of trace and ultratrace concentrations of heavy metals and other electrochemically active substances |
| 20 | High Performance Liquid Chromatography (HPLC) | Shimadzu | Isolation of sufficient quantities of molecular substances. |
| 21 | Vickers Hardness Tester | Matsuzawa/VMT-X | Testing hardness of materials |
| 22 | Zeta sizer | Malvern/Nano ZS-90 | For nanoparticle, colloid and biomolecular particle sizing and particle charge measurements |
| 23 | Electrochemical work station | BioLogic/VSP 300 | Cyclic voltammetry (CV), Electrochemical impedance spectroscopy (EIS), Galvanostatic charge–discharge (GCD) and Stability measurement |